
An Atomic Force Microscopy (AFM, model FlexAFM by Nanosurf AG, Liestal, Switzerland) has recently been installed in the SmArt Device Design (SMAD) laboratory and is available for imaging and characterization of materials down to sub-nanometric scale. The Atomic Force Microscopy (AFM) can be operated in standard imaging modes, such as: Static Force, Lateral Force, Dynamic Force ...
Leggi...