An Atomic Force Microscopy (AFM, model FlexAFM by Nanosurf AG, Liestal, Switzerland) has recently been installed in the SmArt Device Design (SMAD) laboratory and is available for imaging and characterization of materials down to sub-nanometric scale. The Atomic Force Microscopy (AFM) can be operated in standard imaging modes, such as: Static Force, Lateral Force, Dynamic Force (Tapping Mode) and Phase Imaging modes. These features allow for investigating the sample morphology with lateral resolution down to 2 nm and vertical resolution in the sub-nanometric range. In addition, the AFM can locally measure the mechanical elasticity and shear, as well as electrical conductivity and some magnetic properties. It is also endowed with a Kelvin probe, so that the work function of the sample can be locally mapped for correlation with the sample features.
